HITEC 测量显微镜 QZW 1，250 x 170 毫米
HITEC Messtechnik Messmikroskop QZW 1 M3 Software

狀況

二手

位置

Borken

HITEC 测量显微镜 QZW 1，250 x 170 毫米 HITEC Messtechnik Messmikroskop QZW 1 M3 Software

HITEC Messtechnik Messmikroskop QZW 1 M3 Software

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机器数据

機器描述:: HITEC 测量显微镜 QZW 1，250 x 170 毫米

製造商:: HITEC Messtechnik

模型:: Messmikroskop QZW 1 M3 Software

狀況:: 非常好（已使用）

功能性:: 完全功能

价格和位置

位置:: Mollenwieske 4a, 46325 Borken, Deutschland

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优惠详情

產品ID:: A20514605

最後更新:: 於 12.11.2025

描述

We are offering a top-class QZW 1 measuring microscope from HITEC
Type: 250 x 170 mm

M3 software features:
- Automatic edge detection
- Tolerance verification according to DIN/ISO
- Element view with tolerance input
- Part view with dimensioning
- Live image display during measurement
- Additional image storage for your documentation

Dell touch PC with Windows 10 (upgradeable to Windows 11)
Calibration certificate valid until 31.07.2025
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MEASURING RANGE X-, Y-AXIS: 250 x 170 mm
LENGTH DEVIATION: 1.9 μm + L/100 (L in mm)
MEASURING RANGE Z-AXIS: 150 mm
MEASURING SYSTEM Z-AXIS: Optional
CAMERA
USB 3.0, 25 frames/s, 2.0 megapixels
OBJECTIVE LENS
Fixed lens / optional zoom lens 0.7x - 4.5x (manual/motorized)
MAGNIFICATION
40x or 35x - 225x (zoom lens)
FIELD OF VIEW
8 mm or 9 mm - 1.5 mm (zoom lens)
SURFACE LIGHT
4-segment LED ring light (optional coaxial surface light)
TRANSMITTED LIGHT
LED (optional telecentric)
POSITIONING
Laser pointer
TABLE LOAD CAPACITY
Max. 20 kg
DELIVERY CONTENT
QZW1, 23" touchscreen PC, M3 software, calibration certificate, operation manual

Applications
The QZW1 product line supports you in highly precise and repeatable measurements of complex workpieces made from all materials. With numerous options such as a zoom lens, different Z-axis lengths, and various measuring table sizes, the QZW1 offers full flexibility for your part-specific measuring requirements.

廣告是自動翻譯的，翻譯中可能會出現一些錯誤。