HITEC 测量显微镜 QZW 1，行程 400 x 250 毫米

HITEC Messtechnik Messmikroskop QZW 1 M3 Software

We are offering a top-quality QZW 1 measuring microscope from HITEC, model 400 x 250mm.

M3 software features: automatic edge detection, tolerance checks according to DIN/ISO standards, element view with tolerance input, part view with dimensioning, live image display during measurement, and additional image storage for your documentation.

Includes Dell Touch PC with Windows 10 (upgradeable to 11) and calibration certificate valid until 31.07.2025.

MEASURING RANGE X-, Y-AXIS: 400 x 250 mm
LENGTH DEVIATION: 4 μm + L/100 (L in mm)
MEASURING RANGE Z-AXIS: 150 mm (optional: 350 mm)
Z-AXIS MEASURING SYSTEM: optional
CAMERA: USB 3.0, 25 frames/s, 2.0 megapixels
OBJECTIVE LENS: Fixed lens / optional zoom lens 0.7x - 4.5x (manual/motorized)
MAGNIFICATION: 40x / 35x - 225x (with zoom lens)
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FIELD OF VIEW: 8 mm / 9 mm - 1.5 mm (with zoom lens)
SURFACE LIGHT: 4-segment LED ring light (optional coaxial illumination)
TRANSMITTED LIGHT: LED (optional telecentric)
POSITIONING AID: Laser pointer
TABLE LOAD CAPACITY: max. 20 kg
DELIVERY CONTENT: QZW1, 23" touchscreen PC, M3 software, calibration certificate, operation manual.

Applications:

The QZW1 product line supports you in highly accurate and repeatable measurements of complex workpieces made from any material. Thanks to numerous options such as a zoom lens, different Z-axis lengths, and a wide variety of measuring table sizes, the QZW1 provides you with every possibility to meet your specific part measurement requirements.

廣告是自動翻譯的，翻譯中可能會出現一些錯誤。