三丰(Mitutoyo)Crysta-Plus M574 三坐标测量机Mitutoyo
Crysta-Plus M574
三丰(Mitutoyo)Crysta-Plus M574 三坐标测量机
Mitutoyo
Crysta-Plus M574
出厂年份
2010
状况
二手
位置
德国 

机器数据
价格和位置
- 位置:
- , 德国

拨打
技术细节
- X轴行程:
- 500 毫米
- Y轴行程:
- 700 毫米
- Z轴移动距离:
- 400 毫米
- 轴数:
- 3
优惠详情
- 广告编号:
- A22539707
- 参考编号:
- DE-MEA-MIT-2010-00002
- 更新:
- 最近更新时间为 12.08.2026
描述
This 3-axis Mitutoyo Crysta-Plus M574 was manufactured in 2010. It features a measuring range of 500 × 700 × 400 mm and includes a Renishaw MH20i probe head with a TP20 standard force probe system. The machine is equipped with a granite measuring table and multiple styli for enhanced versatility. If you are looking to get high-quality coordinate measuring capabilities, consider the Mitutoyo Crysta-Plus M574 CMM machine we have for sale. Contact us for further details.
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Technical Data
• Measuring Range (X × Y × Z): 500 × 700 × 400 mm
• Probe Head: Renishaw MH20i
• Probe System: TP20 Standard Force
• Probe Module: Standard Force
• Scale Resolution: 0.0001 mm (0.1 µm)
• Probe Ball Diameter: Ø 4 mm
• Stylus Length: 20 mm
• Operating Temperature: +5 °C to +40 °C
• Length Measuring Error (E0, MPE): (5 + 6L/1000) µm
• Single Stylus Form Error (PForm, MPE): 6 µm
• Test Sphere Diameter: Ø 3.994 mm
• Automatic Temperature Compensation: No
• Calibration Date: 10 March 2026
Additional Equipment
• Renishaw MH20i indexing probe head
• TP20 probe system
• Stylus rack
• Multiple styli
• Granite measuring table
• Machine stand
Ndodpfx Aezt Nq Njbyea
Technical Data
• Measuring Range (X × Y × Z): 500 × 700 × 400 mm
• Probe Head: Renishaw MH20i
• Probe System: TP20 Standard Force
• Probe Module: Standard Force
• Scale Resolution: 0.0001 mm (0.1 µm)
• Probe Ball Diameter: Ø 4 mm
• Stylus Length: 20 mm
• Operating Temperature: +5 °C to +40 °C
• Length Measuring Error (E0, MPE): (5 + 6L/1000) µm
• Single Stylus Form Error (PForm, MPE): 6 µm
• Test Sphere Diameter: Ø 3.994 mm
• Automatic Temperature Compensation: No
• Calibration Date: 10 March 2026
Additional Equipment
• Renishaw MH20i indexing probe head
• TP20 probe system
• Stylus rack
• Multiple styli
• Granite measuring table
• Machine stand
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