粗糙度测试仪探针座Hommel
KVA P2
粗糙度测试仪探针座
Hommel
KVA P2
狀況
二手
位置
Wiefelstede 

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价格和位置
- 位置:
- 26215 Wiefelstede, DE
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优惠详情
- 產品ID:
- A9237296
- 參考編號:
- 30461
- 最後更新:
- 於 12.06.2024
描述
Contour measuring device, contour measuring device, contourograph, contourograph, roughness measuring device, roughness measurement, roundness measurement, roughness probe
-Manufacturer: Hommel, probe holder for roughness measuring device
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-Type: KVA type P2/115
-Tactile path: s= 12 mm
-Dimensions box: 345/130/H85 mm
-Weight: 1.7 kg
-Manufacturer: Hommel, probe holder for roughness measuring device
Hfedpjk H R Huefx Adron
-Type: KVA type P2/115
-Tactile path: s= 12 mm
-Dimensions box: 345/130/H85 mm
-Weight: 1.7 kg
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