测量系统Alicona
InfiniteFocusXL200 G5
测量系统
Alicona
InfiniteFocusXL200 G5
製造年份
2017
狀況
二手
位置
Zuchwil 

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价格和位置
- 位置:
- Niedermattstrasse 3a, 4528 Zuchwil, Schweiz

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优惠详情
- 產品ID:
- A20696670
- 最後更新:
- 於 06.12.2025
描述
Alicona InfiniteFocusXL200 G5 Measuring System
Positioning Volume: 200 mm × 200 mm × 200 mm
Maximum Workpiece Weight: 30 kg
Objective Magnifications: 2.5x, 5x, 10xHX, 10x, 20xHX, 20x, 50x, 100x
Chsdpfx Afjx Dxw Tsxsf
Numerical Aperture: 0.075–0.8
Working Distance: 4.5–37 mm
Lateral Measuring Range: 5.63 mm to 0.16 mm
Vertical Resolution: 2300 nm to 10 nm
Measurement Noise: 800 nm to 1 nm
Vertical Measuring Range: 8–36 mm
Measuring Speed: up to 1.7 million measurement points/s
Minimum Measurable Roughness Ra: 7 µm to 0.03 µm
Minimum Measurable Roughness Sa: 3.5 µm to 0.015 µm
Minimum Measurable Height: 2.3 µm to 0.01 µm
Maximum Measurable Area: up to 40,000 mm²
Flatness Accuracy: 0.1 µm (10x objective)
No guarantee is given for the correctness, completeness, or up-to-dateness of the information.
廣告是自動翻譯的,翻譯中可能會出現一些錯誤。
Positioning Volume: 200 mm × 200 mm × 200 mm
Maximum Workpiece Weight: 30 kg
Objective Magnifications: 2.5x, 5x, 10xHX, 10x, 20xHX, 20x, 50x, 100x
Chsdpfx Afjx Dxw Tsxsf
Numerical Aperture: 0.075–0.8
Working Distance: 4.5–37 mm
Lateral Measuring Range: 5.63 mm to 0.16 mm
Vertical Resolution: 2300 nm to 10 nm
Measurement Noise: 800 nm to 1 nm
Vertical Measuring Range: 8–36 mm
Measuring Speed: up to 1.7 million measurement points/s
Minimum Measurable Roughness Ra: 7 µm to 0.03 µm
Minimum Measurable Roughness Sa: 3.5 µm to 0.015 µm
Minimum Measurable Height: 2.3 µm to 0.01 µm
Maximum Measurable Area: up to 40,000 mm²
Flatness Accuracy: 0.1 µm (10x objective)
No guarantee is given for the correctness, completeness, or up-to-dateness of the information.
廣告是自動翻譯的,翻譯中可能會出現一些錯誤。
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